SEM Testing

An SEM is essentially a high magnification microscope, which uses a focused scanned electron beam to produce images of the sample, both top-down and, with the necessary sample preparation, cross-sections. The primary electron beam interacts with the sample in a number of key ways:- Primary electrons generate low energy secondary electrons, which tend to emphasise the topographic nature of the specimen Primary electrons can be backscattered which produces images with a high degree of atomic number (Z) contrast Ionized atoms can relax by electron shell-to-shell transitions, which lead to either X-ray emission or Auger electron ejection. The X-rays emitted are characteristic of the elements in the top few µm of the sample.

For more information call David on 07590 452588 or email us.